The distribution of waiting times between elementary tunneling events is offundamental importance for understanding the stochastic charge transferprocesses in nanoscale conductors. Here we investigate the waiting timedistributions (WTDs) of periodically driven single-electron emitters andevaluate them for the specific example of a mesoscopic capacitor. We show thatthe WTDs provide a particularly informative characterization of periodicallydriven devices and we demonstrate how the WTDs allow us to reconstruct the fullcounting statistics (FCS) of charges that have been transferred after a largenumber of periods. We find that the WTDs are capable of describing short-timephysics and correlations which are not accessible via the FCS alone.
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